Cold field emission and the scanning transmission electron microscope / (notice n° 28233)
000 -LEADER | |
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fixed length control field | 04154cam a2200625Ki 4500 |
001 - CONTROL NUMBER | |
control field | ocn702116505 |
003 - CONTROL NUMBER IDENTIFIER | |
control field | OCoLC |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20211202095211.0 |
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS--GENERAL INFORMATION | |
fixed length control field | m o d |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
fixed length control field | cr cnu---unuuu |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 110216s2009 ne a ob 001 0 eng d |
040 ## - CATALOGING SOURCE | |
Original cataloging agency | N$T |
Language of cataloging | eng |
Transcribing agency | N$T |
Modifying agency | EBLCP |
-- | OCLCQ |
-- | OPELS |
-- | OCLCQ |
-- | OCLCF |
Description conventions | rda |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9780080961583 (electronic bk.) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 0080961584 (electronic bk.) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9780123749864 (electronic bk.) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 0123749867 (electronic bk.) |
035 ## - SYSTEM CONTROL NUMBER | |
System control number | (OCoLC)702116505 |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER | |
Classification number | QR68.5.E45 |
Item number | C65 2009eb |
072 #7 - SUBJECT CATEGORY CODE | |
Subject category code | SCI |
Subject category code subdivision | 041000 |
Source | bisacsh |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 531.16 |
Edition number | 22 |
049 ## - LOCAL HOLDINGS (OCLC) | |
Holding library | TEFA |
245 00 - TITLE STATEMENT | |
Title | Cold field emission and the scanning transmission electron microscope / |
Statement of responsibility, etc | edited by Peter W. Hawkes. |
264 #1 - | |
-- | Amsterdam ; |
-- | Boston : |
-- | Academic Press, |
-- | 2009. |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 1 online resource (xx, 418 pages) : |
Other physical details | illustrations. |
336 ## - CONTENT TYPE | |
Content Type Term | text |
Content Type Code | txt |
Source | rdacontent |
337 ## - MEDIA TYPE | |
Media Type Term | computer |
Media Type Code | c |
Source | rdamedia |
338 ## - CARRIER TYPE | |
Carrier Type Term | online resource |
Carrier Type Code | cr |
Source | rdacarrier |
347 ## - | |
-- | data file |
-- | rda |
380 ## - | |
-- | Bibliography |
490 1# - SERIES STATEMENT | |
Series statement | Advances in imaging and electron physics ; |
Volume number/sequential designation | v. 159 |
504 ## - BIBLIOGRAPHY, ETC. NOTE | |
Bibliography, etc | Includes bibliographical references and index. |
505 00 - FORMATTED CONTENTS NOTE | |
Title | The work of Albert Victor Crewe on the scanning transmission electron microscope and related topics / |
Statement of responsibility | A.V. Crewe -- |
Title | A review of the cold-field electron cathode / |
Statement of responsibility | L.W. Swanson |
Miscellaneous information | and |
Statement of responsibility | G.A. Schwind -- |
Title | History of the STEM at Brookhaven National Laboratory / |
Statement of responsibility | Joseph S. Wall, |
-- | Martha N. Simon, |
Miscellaneous information | and |
Statement of responsibility | James F. Hainfeld -- |
Title | Hitachi's development of cold field emission scanning transmission electron microscopes / |
Statement of responsibility | Hiromi Inada ... [and others] -- |
Title | Two commercial STEMs: the Siemens ST100F and the AEI STEM-1 / |
Statement of responsibility | P.W. Hawkes -- |
Title | A history of vacuum generators' 100-kV scanning transmission electron microscope / |
Statement of responsibility | Ian R.M. Wardell |
Miscellaneous information | and |
Statement of responsibility | Peter E. Bovey -- |
Title | Development of the 300-kV vacuum generator STEM (1985-1996) / |
Statement of responsibility | H.S. von Harrach -- |
Title | On the high-voltage STEM project in Toulouse (MEBATH) / |
Statement of responsibility | Bernard Jouffrey -- |
Title | Scanning transmission electron microscopy: biological applications / |
Statement of responsibility | Andreas Engel -- |
Title | STEM at Cambridge University: reminiscences and reflections from the 1950s and 1960s / |
Statement of responsibility | K.C.A. Smith. |
588 ## - | |
-- | Description based on print version record. |
520 ## - SUMMARY, ETC. | |
Summary, etc | Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope. Updated with contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Provides an invaluable reference and guide for physicists, engineers and mathematicians. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Electron microscopy. |
9 (RLIN) | 38656 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Electronics. |
9 (RLIN) | 38657 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Electrons. |
9 (RLIN) | 38658 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Image processing. |
9 (RLIN) | 38659 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Optical data processing. |
9 (RLIN) | 38660 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Optoelectronic devices. |
9 (RLIN) | 38661 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Physics. |
9 (RLIN) | 38662 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Science. |
9 (RLIN) | 38663 |
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | SCIENCE |
General subdivision | Mechanics |
-- | General. |
Source of heading or term | bisacsh |
9 (RLIN) | 38664 |
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Electron microscopy. |
Source of heading or term | fast |
-- | (OCoLC)fst00906682 |
9 (RLIN) | 38656 |
655 #4 - INDEX TERM--GENRE/FORM | |
Genre/form data or focus term | Electronic books. |
9 (RLIN) | 20 |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Hawkes, P. W. |
9 (RLIN) | 30396 |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
Display text | Print version: |
Title | Cold field emission and the scanning transmission electron microscope. |
Place, publisher, and date of publication | Amsterdam ; Boston : Academic Press, 2009 |
International Standard Book Number | 9780123749864 |
Record control number | (OCoLC)663907385 |
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
Uniform title | Advances in imaging and electron physics ; |
Volume number/sequential designation | v. 159. |
9 (RLIN) | 2504 |
856 40 - ELECTRONIC LOCATION AND ACCESS | |
Uniform Resource Identifier | <a href="http://www.sciencedirect.com/science/book/9780123749864">http://www.sciencedirect.com/science/book/9780123749864</a> |
938 ## - | |
-- | EBL - Ebook Library |
-- | EBLB |
-- | EBL631942 |
938 ## - | |
-- | EBSCOhost |
-- | EBSC |
-- | 351549 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Ebook |
956 ## - LOCAL ELECTRONIC LOCATION AND ACCESS (OCLC) | |
Electronic name | Consortium |
994 ## - | |
-- | C0 |
-- | TEF |
Pas d'exemplaire disponible.