Advances in imaging and electron physics . Volume 162 /
Collection : Advances in imaging and electron physics, 1076-5670 Mention d'édition :1st ed. Détails physiques : 1 online resource (xiv, 275 pages, [8] pages of plates) : illustrations (some color) ISBN :9780123813176 (electronic bk.); 0123813174 (electronic bk.); 9780123813169 (electronic bk.); 0123813166 (electronic bk.).
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Image processing.
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Electrons.
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Electron optics.
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Science.
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Physics.
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SCIENCE
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Physics
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Electromagnetism.
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SCIENCE
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Physics
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Electricity.
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Electronic books.
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Electronic books.
Includes bibliographical references and index.
Font Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Preface; Contributors; Future Contributions; Chapter 1: Energy Filtered X-Ray Photoemission Electron Microscopy; Chapter 2: Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy; Chapter 3: New Dimensions for Field Emission: Effects of Structure in the Emitting Surface; Chapter 4: Conductivity Imaging and Generalized Radon Transform: A Review; Chapter 5: Comparison of Color Demosaicing Methods; Contents of Volumes 151-161; Index; Color Plates.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry expert.
Description based on print version record.
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