Neutron and X-Ray microscopy. Part 2 /
Collection : Advances in imaging and electron physics ; . v. 173 Détails physiques : 1 online resource (360 pages). ISBN :9780123969699 (electronic bk.); 0123969697 (electronic bk.).
Sujet(s) :
Optoelectronic devices.
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Optical data processing.
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Optical data processing.
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Optoelectronic devices.
|
Electronic books.
|
Optical data processing.
|
Optical data processing.
|
Optoelectronic devices.
|
Electronic books.
Ressources en ligne :
Exemplaires : http://www.sciencedirect.com/science/book/9780123969699
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. Key features: * Contributions from leading authorities * Informs and updates on all the latest developments in the field.
Description based on print version record.
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