TY  - BOOK
AU  - Snyder,,Robert L.
AU  - Fiala,,Jaroslav
AU  - Bunge,,Hans J.
TI  - Defect and microstructure analysis by diffraction
T2  - International union of crystallography monographs on crystallography
SN  - 0198501897
U1  - 548.83 
PY  - 2000///
CY  - [S.l.]
PB  - Oxford University Press, USA
KW  - Analytical chemistry
KW  - Physical chemistry
KW  - Diffraction
KW  - X-ray crystallography
KW  - Physical Properties Of Crystals
KW  - Science
KW  - Science/Mathematics
KW  - Chemistry - Analytic
KW  - Crystallography
KW  - Engineering (General)
KW  - Science / Chemistry / Analytic
KW  - Science / Chemistry / Physical & Theoretical
KW  - Science : Crystallography
KW  - Technology & Engineering / Engineering (General)
KW  - Chemistry - Physical & Theoretical
KW  - Analysis
KW  - Crystals
KW  - Defects
KW  - Chemistry
N1  - This book reviews the state of the art for determining the real structure of crystals, taking into account the irregularities and defects that work their way into all crystal arrangements. Understanding these defects is crucial for continued progress in developing new materials
ER  -