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Fundamentals of semiconductor manufacturing and process control par May, Gary S. Publication : [S.l.] Wiley-IEEE Press 2006 . 463 p. , A practical guide to semiconductor manufacturing from process control to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Control covers all issues involved in manufacturing microelectronic devices and circuits, including fabrication sequences, process control, experimental design, process modeling, yield modeling, and CIM/CAM systems. Readers are introduced to both the theory and practice of all basic manufacturing concepts. Following an overview of manufacturing and technology, the text explores process monitoring methods, including those that focus on product wafers and those that focus on the equipment used to produce wafers. Next, the text sets forth some fundamentals of statistics and yield modeling, which set the foundation for a detailed discussion of how statistical process control is used to analyze quality and improve yields. The discussion of statistical experimental design offers readers a powerful approach for systematically varying controllable process conditions and determining their impact on output parameters that measure quality. The authors introduce process modeling concepts, including several advanced process control topics such as run-by-run, supervisory control, and process and equipment diagnosis. Critical coverage includes the following: * Combines process control and semiconductor manufacturing * Unique treatment of system and software technology and management of overall manufacturing systems * Chapters include case studies, sample problems, and suggested exercises * Instructor support includes electronic copies of the figures and an instructor's manual Graduate-level students and industrial practitioners will benefit from the detailed exami?nation of how electronic materials and supplies are converted into finished integrated circuits and electronic products in a high-volume manufacturing environment. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department. An Instructor Support FTP site is also available. 24 cm. Date : 2006 Disponibilité : Exemplaires disponibles: La bibliothèque des sciences de l'ingénieur (1),

Integrated silicon optoelectronics par Zimmermann, Horst Publication : Berlin | Heidelberg Springer 2010 . xix, 385 pages , Previous edition: 2000 24 cm. Date : 2010 Disponibilité : Exemplaires disponibles: La bibliothèque des sciences de l'ingénieur (1),

Microelectronic circuit design par Jaeger, Richard C. Publication : New York Mcgraw Hill 2011 . XXVI, 1334 p. , Richard Jaeger and Travis Blalock present a balanced coverage of analog and digital circuits; students will develop a comprehensive understanding of the basic techniques of modern electronic circuit design, analog and digital, discrete and integrated. A broad spectrum of topics are included in "Microelectronic Circuit Design" which gives the professor the option to easily select and customize the material to satisfy a two-semester or three-quarter sequence in electronics. Jaeger/Blalock emphasizes design through the use of design examples and design notes. Excellent pedagogical elements include chapter opening vignettes, chapter objectives, 'Electronics in Action' boxes, a problem-solving methodology, and 'Design Note' boxes. The use of the well-defined problem-solving methodology presented in this text can significantly enhance an engineer's ability to understand the issues related to design. The design examples assist in building and understanding the design process. 26 cm. Date : 2011 Disponibilité : Exemplaires disponibles: La bibliothèque des sciences de l'ingénieur (1),

Semiconductor manufacturing handbook / par Geng,, Hwaiyu. Publication : [S.l.] : McGraw-Hill Professional, 2005 . 800 p. ; , This handbook will provide engineers with the principles, applications, and solutions needed to design and manage semiconductor manufacturing operations. Consolidating the many complex fields of semiconductor fundamentals and manufacturing into one volume by deploying a team of world class specialists, it allows the quick look up of specific manufacturing reference data across many subdisciplines. 24 cm. Date : 2005 Disponibilité : Exemplaires disponibles: La bibliothèque des sciences de l'ingénieur (1),

X-ray metrology in semiconductor manufacturing par Bowen, D. Keith Publication : Boca Raton CRC/Taylor and Francis 2006 . 279 pages 25 cm. Date : 2006 Disponibilité : Exemplaires disponibles: La bibliothèque des sciences de l'ingénieur (1),

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