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Fundamentals of semiconductor manufacturing and process control par May, Gary S. Publication : [S.l.] Wiley-IEEE Press 2006 . 463 p. , A practical guide to semiconductor manufacturing from process control to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Control covers all issues involved in manufacturing microelectronic devices and circuits, including fabrication sequences, process control, experimental design, process modeling, yield modeling, and CIM/CAM systems. Readers are introduced to both the theory and practice of all basic manufacturing concepts. Following an overview of manufacturing and technology, the text explores process monitoring methods, including those that focus on product wafers and those that focus on the equipment used to produce wafers. Next, the text sets forth some fundamentals of statistics and yield modeling, which set the foundation for a detailed discussion of how statistical process control is used to analyze quality and improve yields. The discussion of statistical experimental design offers readers a powerful approach for systematically varying controllable process conditions and determining their impact on output parameters that measure quality. The authors introduce process modeling concepts, including several advanced process control topics such as run-by-run, supervisory control, and process and equipment diagnosis. Critical coverage includes the following: * Combines process control and semiconductor manufacturing * Unique treatment of system and software technology and management of overall manufacturing systems * Chapters include case studies, sample problems, and suggested exercises * Instructor support includes electronic copies of the figures and an instructor's manual Graduate-level students and industrial practitioners will benefit from the detailed exami?nation of how electronic materials and supplies are converted into finished integrated circuits and electronic products in a high-volume manufacturing environment. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department. An Instructor Support FTP site is also available. 24 cm. Date : 2006 Disponibilité : Exemplaires disponibles: La bibliothèque des sciences de l'ingénieur (1),

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Design Exploration of Emerging Nano-scale Non-volatile Memory par Yu, Hao. Publication : . X, 192 p. 377 illus. Disponibilité :  http://dx.doi.org/10.1007/978-1-4939-0551-5,

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Trace-Based Post-Silicon Validation for VLSI Circuits par Liu, Xiao. Publication : . XV, 108 p. 59 illus., 38 illus. in color. Disponibilité :  http://dx.doi.org/10.1007/978-3-319-00533-1,

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Exploring Memory Hierarchy Design with Emerging Memory Technologies par Sun, Guangyu. Publication : . VII, 122 p. 71 illus., 57 illus. in color. Disponibilité :  http://dx.doi.org/10.1007/978-3-319-00681-9,

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MOSFET Technologies for Double-Pole Four-Throw Radio-Frequency Switch par Srivastava, Viranjay M. Publication : . XV, 199 p. 55 illus., 45 illus. in color. Disponibilité :  http://dx.doi.org/10.1007/978-3-319-01165-3,

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Advanced Materials for Integrated Optical Waveguides par Tong Ph.D, Xingcun Colin. Publication : . XXVII, 552 p. 124 illus. in color. Disponibilité :  http://dx.doi.org/10.1007/978-3-319-01550-7,

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Self-Organized Quantum Dots for Memories Electronic Properties and Carrier Dynamics / par Nowozin, Tobias. Publication : . XVI, 153 p. 91 illus., 9 illus. in color. Disponibilité :  http://dx.doi.org/10.1007/978-3-319-01970-3,

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Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs par Noia, Brandon. Publication : . XVIII, 245 p. 133 illus., 115 illus. in color. Disponibilité :  http://dx.doi.org/10.1007/978-3-319-02378-6,

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Delta-Sigma A/D-Converters Practical Design for Communication Systems / par Gaggl, Richard. Publication : . XVIII, 146 p. Disponibilité :  http://dx.doi.org/10.1007/978-3-642-34543-2,

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Flash Memories Economic Principles of Performance, Cost and Reliability Optimization / par Richter, Detlev. Publication : . XXIV, 268 p. 185 illus. Disponibilité :  http://dx.doi.org/10.1007/978-94-007-6082-0,

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High Mobility and Quantum Well Transistors Design and TCAD Simulation / par Hellings, Geert. Publication : . XVIII, 140 p. Disponibilité :  http://dx.doi.org/10.1007/978-94-007-6340-1,

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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications par Franco, Jacopo. Publication : . XIX, 187 p. 219 illus. Disponibilité :  http://dx.doi.org/10.1007/978-94-007-7663-0,

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Semiconductor Technologies in the Era of Electronics par Kang, Yong Hoon. Publication : . VII, 149 p. 98 illus. Disponibilité :  http://dx.doi.org/10.1007/978-94-017-8768-0,

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