Bibliothèque de L'IMIST/CNRST

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Metal based thin films for electronics par Klaus, Wetzig. Publication : , This up-to-date handbook covers the main topics of preparation, characterization and properties of complex metal-based layer systems. The authors -- an outstanding group of researchers -- discuss advanced methods for structure, chemical and electronic state characterization with reference to the properties of thin functional layers,such as metalization and barrier layers for microelectronics, magnetoresistive layers for GMR and TMR, sensor and resistance layers. As such, the book addresses materials specialists in industry, especially in microelectronics, as well as scientists, while also recommended for advanced studies in materials science, analytics, surface and solid state science. | Notes bibliogr. Disponibilité : Exemplaires disponibles: La bibliothèque des sciences de l'ingénieur (1),

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Metallic multilayers and their applications Theory, experiments, and applications related to thin metallic multilayers par Fernando, Gayanath W. Publication : Amsterdam | Boston Elsevier 2008 . xix, 220 pages , Thin metallic multilayer films have become an important part in today's computer technology. The giant magnetoresistance (GMR) effect, which plays a central role here, was discovered in the late 1980s. This can be essentially described as the effect of a magnetic field on the electron transport leading to significant changes in the resistance. Other aspects of multilayers systems, such as stability, growth, confinement are also addressed. Theoretical and experimental methods used in such work are described in some detail, with special emphasis on density functional and spin density functional theories. Magnetic anisotropy in thin films is also discussed while addressing unresolved issues and new results from exchange-bias experiments. * Discusses the GMR effect * What makes multilayers interesting and useful? * What are the latest discoveries in this field? * Simple insights in to the physics behind multilayers * Novel concepts at small length scales * Theoretical and experimental background. 25 cm. Date : 2008 Disponibilité : Exemplaires disponibles: La bibliothèque des sciences de l'ingénieur (1),

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