IMIST


Cold field emission and the scanning transmission electron microscope / edited by Peter W. Hawkes. - 1 online resource (xx, 418 pages) : illustrations. - Advances in imaging and electron physics ; v. 159 . - Advances in imaging and electron physics ; v. 159. .

Includes bibliographical references and index.

The work of Albert Victor Crewe on the scanning transmission electron microscope and related topics / A review of the cold-field electron cathode / History of the STEM at Brookhaven National Laboratory / Hitachi's development of cold field emission scanning transmission electron microscopes / Two commercial STEMs: the Siemens ST100F and the AEI STEM-1 / A history of vacuum generators' 100-kV scanning transmission electron microscope / Development of the 300-kV vacuum generator STEM (1985-1996) / On the high-voltage STEM project in Toulouse (MEBATH) / Scanning transmission electron microscopy: biological applications / STEM at Cambridge University: reminiscences and reflections from the 1950s and 1960s / A.V. Crewe -- L.W. Swanson G.A. Schwind -- Joseph S. Wall, Martha N. Simon, James F. Hainfeld -- Hiromi Inada ... [and others] -- P.W. Hawkes -- Ian R.M. Wardell Peter E. Bovey -- H.S. von Harrach -- Bernard Jouffrey -- Andreas Engel -- K.C.A. Smith. and and and

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope. Updated with contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Provides an invaluable reference and guide for physicists, engineers and mathematicians.

9780080961583 (electronic bk.) 0080961584 (electronic bk.) 9780123749864 (electronic bk.) 0123749867 (electronic bk.)


Electron microscopy.
Electronics.
Electrons.
Image processing.
Optical data processing.
Optoelectronic devices.
Physics.
Science.
SCIENCE--Mechanics--General.
Electron microscopy.


Electronic books.

QR68.5.E45 / C65 2009eb

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