Neutron and X-Ray microscopy. Part 2 /
edited by Ted Cremer.
- 1 online resource (360 pages).
- Advances in imaging and electron physics ; v. 173 .
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. Key features: * Contributions from leading authorities * Informs and updates on all the latest developments in the field.
9780123969699 (electronic bk.) 0123969697 (electronic bk.)
381179 MIL
Optoelectronic devices.
Optical data processing.
Optical data processing.
Optoelectronic devices.
Electronic books.
TK7800 / .A37 2012eb
621.3/67
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. Key features: * Contributions from leading authorities * Informs and updates on all the latest developments in the field.
9780123969699 (electronic bk.) 0123969697 (electronic bk.)
381179 MIL
Optoelectronic devices.
Optical data processing.
Optical data processing.
Optoelectronic devices.
Electronic books.
TK7800 / .A37 2012eb
621.3/67
