IMIST


Advances in imaging and electron physics . (notice n° 28227)

000 -LEADER
fixed length control field 03455cam a2200589Li 4500
001 - CONTROL NUMBER
control field ocn646803052
003 - CONTROL NUMBER IDENTIFIER
control field OCoLC
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20211202095159.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS--GENERAL INFORMATION
fixed length control field m o u
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr cn|||||||||
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 090531s2008 ne a ob 001 0 eng d
040 ## - CATALOGING SOURCE
Original cataloging agency E7B
Language of cataloging eng
Transcribing agency E7B
Modifying agency OCLCQ
-- UBY
-- OCLCQ
-- OPELS
-- OCLCQ
-- OCLCF
Description conventions rda
019 ## -
-- 505132910
-- 712982269
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780123742209 (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 012374220X (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Cancelled/invalid ISBN 9780080880358
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)646803052
Canceled/invalid control number (OCoLC)505132910
-- (OCoLC)712982269
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC793.5.E62
Item number A3153 2008eb
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815/2
Edition number 23
049 ## - LOCAL HOLDINGS (OCLC)
Holding library TEFA
245 00 - TITLE STATEMENT
Title Advances in imaging and electron physics .
Number of part/section of a work Volume 153,
Name of part/section of a work Aberration-corrected microscopy /
Statement of responsibility, etc Peter W. Hawkes.
246 3# - VARYING FORM OF TITLE
Title proper/short title Aberration-corrected microscopy
250 ## - EDITION STATEMENT
Edition statement 1st ed.
264 #1 -
-- Amsterdam ;
-- Boston :
-- Academic Press,
-- 2008.
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource (xix, 538 pages) :
Other physical details illustrations.
336 ## - CONTENT TYPE
Content Type Term text
Content Type Code txt
Source rdacontent
337 ## - MEDIA TYPE
Media Type Term computer
Media Type Code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier Type Term online resource
Carrier Type Code cr
Source rdacarrier
347 ## -
-- data file
-- rda
380 ## -
-- Bibliography
490 0# - SERIES STATEMENT
Series statement Advances in imaging and electron physics ;
Volume number/sequential designation v. 153
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographical references and index.
588 ## -
-- Description based on print version record.
520 ## - SUMMARY, ETC.
Summary, etc The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the materials scientist could study the structure of metals and alloys and many other substances, and especially their defects. But even the electron microscope had limits, and truly atomic structure was still too small to be observed directly. The so-called 'limit of resolution' of the microscope was well understood but attempts to use the necessary correctors were unsuccessful until the late 1990s. Such correctors now equip many microscopes in Europe, the USA and Japan and the results are extremely impressive. Moreover, microscopists feel that they are only at the beginning of a new era of subatomic microscopical imaging. In the present volume, we have brought together the principal contributors, instrument designers and microscopists to discuss this topic in depth. * First book on the subject of correctors * Well known contributors from academia and microscope manufacturers * Provides an ideal starting point for preparing funding proposals.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Optoelectronic devices.
9 (RLIN) 38635
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Optical data processing.
9 (RLIN) 38636
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Transmission electron microscopy.
9 (RLIN) 38637
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Scanning transmission electron microscopy.
9 (RLIN) 38638
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Aberration.
9 (RLIN) 38639
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Aberration.
Source of heading or term fast
-- (OCoLC)fst00794369
9 (RLIN) 38639
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Optical data processing.
Source of heading or term fast
-- (OCoLC)fst01046675
9 (RLIN) 38636
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Optoelectronic devices.
Source of heading or term fast
-- (OCoLC)fst01046908
9 (RLIN) 38635
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Scanning transmission electron microscopy.
Source of heading or term fast
-- (OCoLC)fst01106494
9 (RLIN) 38638
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Transmission electron microscopy.
Source of heading or term fast
-- (OCoLC)fst01154860
9 (RLIN) 38637
655 #4 - INDEX TERM--GENRE/FORM
Genre/form data or focus term Electronic books.
9 (RLIN) 20
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Hawkes, P. W.
9 (RLIN) 30396
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="http://www.sciencedirect.com/science/book/9780123742209">http://www.sciencedirect.com/science/book/9780123742209</a>
938 ## -
-- ebrary
-- EBRY
-- ebr10282333
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Ebook
956 ## - LOCAL ELECTRONIC LOCATION AND ACCESS (OCLC)
Electronic name Consortium
994 ## -
-- C0
-- TEF

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