Silicon-based millimeter-wave technology measurement, modeling and applications / (notice n° 28248)
| 000 -LEADER | |
|---|---|
| fixed length control field | 02715cam a2200565Mi 4500 |
| 001 - CONTROL NUMBER | |
| control field | ocn823743229 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | OCoLC |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20211202095232.0 |
| 006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS--GENERAL INFORMATION | |
| fixed length control field | m o u |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
| fixed length control field | cr cn||||||||| |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 121105s2012 ne a ob 001 0 eng d |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | E7B |
| Language of cataloging | eng |
| Transcribing agency | E7B |
| Modifying agency | OCLCQ |
| -- | OCLCO |
| -- | OPELS |
| -- | N$T |
| -- | YDXCP |
| -- | OCLCF |
| -- | OCLCO |
| Description conventions | rda |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9780123946362 (electronic bk.) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0123946360 (electronic bk.) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| Cancelled/invalid ISBN | 9780123942982 |
| 029 1# - (OCLC) | |
| -- | NZ1 |
| -- | 15197959 |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | (OCoLC)823743229 |
| 050 #4 - LIBRARY OF CONGRESS CALL NUMBER | |
| Classification number | TK7876.5 |
| Item number | .S54 2012eb |
| 072 #7 - SUBJECT CATEGORY CODE | |
| Subject category code | TEC |
| Subject category code subdivision | 008010 |
| Source | bisacsh |
| 072 #7 - SUBJECT CATEGORY CODE | |
| Subject category code | TEC |
| Subject category code subdivision | 008020 |
| Source | bisacsh |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.3815 |
| Edition number | 23 |
| 049 ## - LOCAL HOLDINGS (OCLC) | |
| Holding library | TEFA |
| 245 00 - TITLE STATEMENT | |
| Title | Silicon-based millimeter-wave technology measurement, modeling and applications / |
| Statement of responsibility, etc | edited by M. Jamal Deen. |
| 264 #1 - | |
| -- | Amsterdam : |
| -- | Elsevier/Academic Press, |
| -- | 2012. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 1 online resource (xx, 483 pages) : |
| Other physical details | illustrations. |
| 336 ## - CONTENT TYPE | |
| Content Type Term | text |
| Content Type Code | txt |
| Source | rdacontent |
| 337 ## - MEDIA TYPE | |
| Media Type Term | computer |
| Media Type Code | c |
| Source | rdamedia |
| 338 ## - CARRIER TYPE | |
| Carrier Type Term | online resource |
| Carrier Type Code | cr |
| Source | rdacarrier |
| 347 ## - | |
| -- | data file |
| -- | rda |
| 380 ## - | |
| -- | Bibliography |
| 490 1# - SERIES STATEMENT | |
| Series statement | Advances in imaging and electron physics ; |
| Volume number/sequential designation | v. 174 |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc | Includes bibliographical references and index. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Key features: Contributions from leading authorities. Informs and updates on all the latest developments in the field. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Millimeter wave devices. |
| 9 (RLIN) | 38712 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Silicon crystals. |
| 9 (RLIN) | 6233 |
| 650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General |
| Source of heading or term | bisacsh |
| 9 (RLIN) | 38713 |
| 650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated |
| Source of heading or term | bisacsh |
| 9 (RLIN) | 38714 |
| 650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Millimeter wave devices. |
| Source of heading or term | fast |
| -- | (OCoLC)fst01021815 |
| 9 (RLIN) | 38712 |
| 650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Silicon crystals. |
| Source of heading or term | fast |
| -- | (OCoLC)fst01118668 |
| 9 (RLIN) | 6233 |
| 655 #4 - INDEX TERM--GENRE/FORM | |
| Genre/form data or focus term | Electronic books. |
| 9 (RLIN) | 20 |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Cremer, Jay Theodore, |
| Titles and other words associated with a name | Jr. |
| 9 (RLIN) | 38708 |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
| Uniform title | Advances in imaging and electron physics ; |
| Volume number/sequential designation | v. 174. |
| 9 (RLIN) | 2504 |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | <a href="http://www.sciencedirect.com/science/book/9780123942982">http://www.sciencedirect.com/science/book/9780123942982</a> |
| 938 ## - | |
| -- | ebrary |
| -- | EBRY |
| -- | ebr10621424 |
| 938 ## - | |
| -- | EBSCOhost |
| -- | EBSC |
| -- | 500218 |
| 938 ## - | |
| -- | YBP Library Services |
| -- | YANK |
| -- | 9906436 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Ebook |
| 956 ## - LOCAL ELECTRONIC LOCATION AND ACCESS (OCLC) | |
| Electronic name | Consortium |
| 994 ## - | |
| -- | C0 |
| -- | TEF |
Pas d'exemplaire disponible.
