TY  - BOOK
AU  - Kumar,Challa S.S.R.
ED  - SpringerLink (Online service)
TI  - Transmission Electron Microscopy Characterization of Nanomaterials
SN  - 9783642389344
AV  - QD1-999 
U1  - 540 23
PY  - 2014///
CY  - Berlin, Heidelberg
PB  - Springer Berlin Heidelberg, Imprint: Springer
KW  - Chemistry
KW  - Nanochemistry
KW  - Nanoscale science
KW  - Nanoscience
KW  - Nanostructures
KW  - Materials science
KW  - Chemistry/Food Science, general
KW  - Materials Science, general
KW  - Nanoscale Science and Technology
N1  - TEM Characterization of Biological and Inorganic Nanocomposites -- Electron Microscopy of Thin Film Inorganic and Organic Photovoltaic Materials -- TEM for Characterization of Semiconductor Nanomaterials -- Study of Polymeric Nano-Composites by 3D-TEM and Related Techniques.-TEM for Characterization of Nanowires and Nanorods -- TEM for Characterization of Core-Shell Nanomaterials -- Valence Electron Spectroscopy by Transmission Electron Microscopy -- TEM Characterization of Nanocomposite Materials -- High Resolution in STEM Mode: Individual Atom Analysis in Semiconductor Nanowires -- Electron Microscopy for Characterization of Thermoelectric Nanomaterials -- TEM for Characterization of Nanocomposites Oxide Thin Films: A Case Study on Solution-Derived Lanthanum Strontium Manganites -- TEM Characterization of Metallic Nanocatalysts -- 3D Electron Microscopy Applied to Nanoscience.-Transmission Electron Microscopy of 1D-Nanostructures
N2  - Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry
UR  - http://dx.doi.org/10.1007/978-3-642-38934-4
ER  -